Scherrer Equation:
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The Scherrer equation is used in X-ray diffraction (XRD) to estimate the size of crystalline particles from the broadening of diffraction peaks. It relates the particle size to the peak width at half maximum (FWHM), X-ray wavelength, and diffraction angle.
The calculator uses the Scherrer equation:
Where:
Explanation: The equation accounts for the broadening of diffraction peaks due to finite crystallite size, with smaller particles producing broader peaks.
Details: Particle size determination is crucial in materials science for understanding material properties, catalytic activity, and performance in various applications.
Tips: Enter wavelength in nm, FWHM in radians, and angle in degrees. All values must be positive (angle between 0-90°).
Q1: What is the Scherrer constant (0.94)?
A: It's a shape factor that depends on crystallite shape and how width is measured. 0.94 is common for spherical crystals with FWHM.
Q2: What are typical wavelength values?
A: Common X-ray sources: Cu Kα (0.154 nm), Co Kα (0.179 nm), Mo Kα (0.071 nm).
Q3: What are limitations of the Scherrer equation?
A: It doesn't account for strain broadening and is accurate only for sizes below ~100-200 nm.
Q4: How to convert FWHM from degrees to radians?
A: Multiply degrees by (π/180). Some XRD software provides values directly in radians.
Q5: Can this be used for all crystal systems?
A: Yes, but results are most accurate for isotropic materials and when using the most intense peak.